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Temperature dependent responsivity of quantum dot infrared photodetectors

dc.citation.epage170en_US
dc.citation.issue2-3en_US
dc.citation.spage166en_US
dc.citation.volume50en_US
dc.citation.woscount15
dc.contributor.authorWang, S. Y.en_US
dc.contributor.authorLo, M. C.en_US
dc.contributor.authorHsiao, H. Y.en_US
dc.contributor.authorLing, H. S.en_US
dc.contributor.authorLee, C. P.en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:14:21Z
dc.date.available2014-12-08T15:14:21Z
dc.date.issued2007-04-01en_US
dc.description.abstractTemperature dependent behavior of the responsivity of InAs/GaAs quantum dot infrared photoderectors was investigated with detailed measurement of the current gain. The current gain varied about two orders of magnitude with 100 K temperature change. Meanwhile, the change in quantum efficiency is within a factor of 10. The dramatic change of the current gain is explained by the repulsive coulomb potential of the extra carriers in the QDs. With the measured current gain, the extra carrier number in QDs was calculated. More than one electron per QD could be captured as the dark current increases at 150 K. The extra electrons in the QDs elevated the Fermi level and changed the quantum efficiency of the QDIPs. The temperature dependence of the responsivity was qualitatively explained with the extra electrons. (c) 2006 Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.infrared.2006.10.027en_US
dc.identifier.issn1350-4495en_US
dc.identifier.journalINFRARED PHYSICS & TECHNOLOGYen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.infrared.2006.10.027en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/10953
dc.identifier.wosnumberWOS:000246598000014
dc.language.isoen_USen_US
dc.subjectquantum doten_US
dc.subjectintersubbanden_US
dc.subjectinfrared detectoren_US
dc.titleTemperature dependent responsivity of quantum dot infrared photodetectorsen_US
dc.typeArticleen_US

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