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Common-path heterodyne interferometric detection scheme for measuring wavelength shift

dc.citation.epage10en_US
dc.citation.issue1-3en_US
dc.citation.spage7en_US
dc.citation.volume162en_US
dc.citation.woscount1
dc.contributor.authorLee, JYen_US
dc.contributor.authorSu, DCen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:46:45Z
dc.date.available2014-12-08T15:46:45Z
dc.date.issued1999-04-01en_US
dc.description.abstractWhen a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations, These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry. (C) 1999 Elsevier Science B.V. All rights reserved.en_US
dc.identifier.doi10.1016/S0030-4018(99)00074-7en_US
dc.identifier.issn0030-4018en_US
dc.identifier.journalOPTICS COMMUNICATIONSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0030-4018(99)00074-7en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/31439
dc.identifier.wosnumberWOS:000079947000002
dc.language.isoen_USen_US
dc.subjectwavelength shiften_US
dc.subjectheterodyne interferometryen_US
dc.titleCommon-path heterodyne interferometric detection scheme for measuring wavelength shiften_US
dc.typeArticleen_US

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