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學術出版;;Publications
會議論文;;Conferences Paper
Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
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000262360800056.pdf
(546.09 KB)
Date
2007
Authors
Li, Yiming
Hwang, Chih-Hong
Huang, Hsuan-Ming
Yeh, Ta-Ching
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DOI
10.1109/IVS.2007.4290101
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http://dx.doi.org/10.1109/IVS.2007.4290101
https://ir.lib.nycu.edu.tw/handle/11536/11445
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