Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
| dc.citation.epage | 118 | en_US |
| dc.citation.spage | 117 | en_US |
| dc.contributor.author | Li, Yiming | en_US |
| dc.contributor.author | Hwang, Chih-Hong | en_US |
| dc.contributor.author | Huang, Hsuan-Ming | en_US |
| dc.contributor.author | Yeh, Ta-Ching | en_US |
| dc.contributor.department | 電信工程研究所 | zh_TW |
| dc.contributor.department | Institute of Communications Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:15:13Z | |
| dc.date.available | 2014-12-08T15:15:13Z | |
| dc.date.issued | 2007 | en_US |
| dc.identifier.doi | 10.1109/IVS.2007.4290101 | en_US |
| dc.identifier.isbn | 978-1-4244-0879-5 | en_US |
| dc.identifier.issn | 1078-621X | en_US |
| dc.identifier.journal | 2007 IEEE INTERNATIONAL SOI CONFERENCE PROCEEDINGS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/IVS.2007.4290101 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/11445 | |
| dc.identifier.wosnumber | WOS:000262360800056 | |
| dc.language.iso | en_US | en_US |
| dc.title | Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices | en_US |
| dc.type | Proceedings Paper | en_US |