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The evolution of Ge nanostructures growth on silicon substrate by reduction of GeO2

dc.citation.epage2195en_US
dc.citation.issue6en_US
dc.citation.spage2190en_US
dc.citation.volume14en_US
dc.citation.woscount1
dc.contributor.authorWu, Hung-Chien_US
dc.contributor.authorChiu, Hsin-Tienen_US
dc.contributor.authorLee, Chi-Youngen_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.date.accessioned2014-12-08T15:22:06Z
dc.date.available2014-12-08T15:22:06Z
dc.date.issued2012en_US
dc.description.abstractVarious shaped and sized Ge nanostructures were obtained by reducing GeO2 powder under a H-2 atmosphere in a high-temperature tubular furnace. At a high depositing temperature region, crystalline Ge film was epitaxially grown on a silicon substrate. Jellyfish-like Ge/SiO(2)NWs composite structures were obtained next to germanium epitaxial film grown by Ge-catalyzed vapor-liquid-solid phase segregation mechanism. In addition, at the lower depositing temperature zones, Ge nanowires with various morphologies were formed owing to the temperature and concentration gradient by oxide-assisted vapor-solid mechanism and Ostwald ripening.en_US
dc.identifier.doi10.1039/c2ce06485een_US
dc.identifier.issn1466-8033en_US
dc.identifier.journalCRYSTENGCOMMen_US
dc.identifier.urihttp://dx.doi.org/10.1039/c2ce06485een_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/15695
dc.identifier.wosnumberWOS:000300443200042
dc.language.isoen_USen_US
dc.titleThe evolution of Ge nanostructures growth on silicon substrate by reduction of GeO2en_US
dc.typeArticleen_US

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