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Modified weighted standard deviation index for adequately interpreting a supplier's lognormal process capability

dc.citation.epage1008en_US
dc.citation.spage999en_US
dc.citation.volume233en_US
dc.citation.woscount0en_US
dc.contributor.authorLiao, Mou-Yuanen_US
dc.contributor.authorPearn, W. L.en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2019-04-02T06:00:15Z
dc.date.available2019-04-02T06:00:15Z
dc.date.issued2019-02-01en_US
dc.description.abstractThe process capability index has become an efficient tool for measuring a supplier's process performance. Cpk(WSD) is one popularly used index for assessing non-normal process capability when the process violates the normality assumption. Unfortunately, this index cannot accurately reflect the process yield, so it may produce a serious result if the practitioner compares the calculated Cpk(WSD) value with the capability requirement to determine whether the process meets that requirement. Hence, this study modifies Cpk(WSD) to provide an adequate measure of lognormal process capability. In addition, an estimator of this modified index is also provided. Simulations show that the bias of this estimator is slight, and the coverage probability of capability testing is close to the nominal confidence. This means that our proposed method is adaptable for use.en_US
dc.identifier.doi10.1177/0954405418755820en_US
dc.identifier.issn0954-4054en_US
dc.identifier.journalPROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTUREen_US
dc.identifier.urihttp://dx.doi.org/10.1177/0954405418755820en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/148761
dc.identifier.wosnumberWOS:000456544300027en_US
dc.language.isoen_USen_US
dc.subjectLognormalen_US
dc.subjectprocess capabilityen_US
dc.subjectsupplier evaluationen_US
dc.subjectyielden_US
dc.titleModified weighted standard deviation index for adequately interpreting a supplier's lognormal process capabilityen_US
dc.typeArticleen_US

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