EXAFS study of thermoelectric BiCuOSe: Effects of Cu vacancies
| dc.citation.epage | 16 | en_US |
| dc.citation.spage | 12 | en_US |
| dc.citation.volume | 206 | en_US |
| dc.citation.woscount | 1 | en_US |
| dc.contributor.author | Chou, Ta-Lei | en_US |
| dc.contributor.author | Tewari, Girish C. | en_US |
| dc.contributor.author | Chan, Ting-Shan | en_US |
| dc.contributor.author | Hsu, Ying-Ya | en_US |
| dc.contributor.author | Yamauchi, Hisao | en_US |
| dc.contributor.author | Karppinen, Maarit | en_US |
| dc.contributor.department | 加速器光源科技與應用學位學程 | zh_TW |
| dc.contributor.department | Master and Ph.D. Program for Science and Technology of Accelrrator Light Source | en_US |
| dc.date.accessioned | 2015-07-21T08:29:12Z | |
| dc.date.available | 2015-07-21T08:29:12Z | |
| dc.date.issued | 2015-03-01 | en_US |
| dc.description.abstract | Excellent thermoelectric performance has been reported for the ZrCuSiAs-type BiCuOSe derivatives; for these materials the transport properties can be effectively adjusted by chemical substitutions or by introducing Cu vacancies. In this work we compare stoichiometric BiCuSeO and its Cu-deficient derivative BiCu0.95SeO by utilizing temperature dependent extended X-ray absorption fine structure (EXAFS) measurements. Such a local probe evidences that Cu vacancies make the lattice more ductile and susceptible to temperature variation. (C) 2015 Elsevier Ltd. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.ssc.2015.01.007 | en_US |
| dc.identifier.issn | 0038-1098 | en_US |
| dc.identifier.journal | SOLID STATE COMMUNICATIONS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.ssc.2015.01.007 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/124311 | |
| dc.identifier.wosnumber | WOS:000350109300003 | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | Semiconductors | en_US |
| dc.subject | EXAFS | en_US |
| dc.subject | Synchrotron radiation | en_US |
| dc.subject | X-ray spectroscopies | en_US |
| dc.title | EXAFS study of thermoelectric BiCuOSe: Effects of Cu vacancies | en_US |
| dc.type | Article | en_US |
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