CONTACT RESISTIVITIES OF AL AND TI ON SI MEASURED BY A SELF-ALIGNED VERTICAL KELVIN TEST RESISTOR STRUCTURE
| dc.citation.epage | 1001 | en_US |
| dc.citation.issue | 11 | en_US |
| dc.citation.spage | 997 | en_US |
| dc.citation.volume | 32 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | WEN, LY | en_US |
| dc.contributor.author | TAN, FL | en_US |
| dc.contributor.author | CHUNG, LL | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:05:44Z | |
| dc.date.available | 2014-12-08T15:05:44Z | |
| dc.date.issued | 1989-11-01 | en_US |
| dc.identifier.issn | 0038-1101 | en_US |
| dc.identifier.journal | SOLID-STATE ELECTRONICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4266 | |
| dc.identifier.wosnumber | WOS:A1989CB85900011 | |
| dc.language.iso | en_US | en_US |
| dc.title | CONTACT RESISTIVITIES OF AL AND TI ON SI MEASURED BY A SELF-ALIGNED VERTICAL KELVIN TEST RESISTOR STRUCTURE | en_US |
| dc.type | Article | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: