THE CHEMICAL STAIN INSPECTION OF POLYSILICON SOLAR CELL WAFER BY THE FUZZY THEORY METHOD
| dc.citation.epage | 406 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 391 | en_US |
| dc.citation.volume | 19 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Lin, Chern-Sheng | en_US |
| dc.contributor.author | Lin, Chih-Wei | en_US |
| dc.contributor.author | Yang, Shih-Wei | en_US |
| dc.contributor.author | Lin, Shir-Kuan | en_US |
| dc.contributor.author | Chiu, Chuang-Chien | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:33:07Z | |
| dc.date.available | 2014-12-08T15:33:07Z | |
| dc.date.issued | 2013-08-01 | en_US |
| dc.description.abstract | This study proposed an automatic optical inspection (AOI) technique to improve the inspection of chemical stains on solar wafers. Poly-silicon solar cell wafers were inspected for chemical stains, and the inspection was rapid and stable. The system used a laser-reflection-point-based AOI method for solar wafer chemical stain inspection. Based on the fuzzy theory, the image binarization algorithm could efficiently filter irrelevant image information, and the back-propagation method was also utilized to determine if the image was stained. The inspection algorithm integrated fuzzy theory and the back-propagation method in order to shorten the comparison time and quickly find the target. The experiment proved that the validity of the proposed method could achieve a recognition rate of 98% from among 1000 images. | en_US |
| dc.identifier.doi | 10.1080/10798587.2013.778052 | en_US |
| dc.identifier.issn | 1079-8587 | en_US |
| dc.identifier.journal | INTELLIGENT AUTOMATION AND SOFT COMPUTING | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1080/10798587.2013.778052 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/23048 | |
| dc.identifier.wosnumber | WOS:000326140200016 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Solar wafer | en_US |
| dc.subject | Laser-reflection-point based AOI method | en_US |
| dc.subject | Chemical stain inspection | en_US |
| dc.subject | Fuzzy theory | en_US |
| dc.subject | Back-propagation | en_US |
| dc.subject | Image binarization algorithm | en_US |
| dc.subject | Stain recognition | en_US |
| dc.title | THE CHEMICAL STAIN INSPECTION OF POLYSILICON SOLAR CELL WAFER BY THE FUZZY THEORY METHOD | en_US |
| dc.type | Article | en_US |