A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY
| dc.citation.epage | 261 | en_US |
| dc.citation.issue | 4 | en_US |
| dc.citation.spage | 259 | en_US |
| dc.citation.volume | 7 | en_US |
| dc.citation.woscount | 4 | |
| dc.contributor.author | LEI, TF | en_US |
| dc.contributor.author | LEU, LY | en_US |
| dc.contributor.author | LEE, CL | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:06:11Z | |
| dc.date.available | 2014-12-08T15:06:11Z | |
| dc.date.issued | 1986-04-01 | en_US |
| dc.identifier.issn | 0741-3106 | en_US |
| dc.identifier.journal | IEEE ELECTRON DEVICE LETTERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4754 | |
| dc.identifier.wosnumber | WOS:A1986A770700020 | |
| dc.language.iso | en_US | en_US |
| dc.title | A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY | en_US |
| dc.type | Article | en_US |