Far-field emission narrowing effect of microdisk lasers

dc.citation.epage2225en_US
dc.citation.issue18en_US
dc.citation.spage2223en_US
dc.citation.volume72en_US
dc.citation.woscount19
dc.contributor.authorLee, TDen_US
dc.contributor.authorCheng, PHen_US
dc.contributor.authorPan, JSen_US
dc.contributor.authorTsai, RSen_US
dc.contributor.authorLai, Yen_US
dc.contributor.authorTai, Ken_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:49:06Z
dc.date.available2014-12-08T15:49:06Z
dc.date.issued1998-05-04en_US
dc.description.abstractFar-field intensity distribution of semiconductor microdisk lasers is experimentally measured and the emission angle is found to be much smaller than that of a planar source with the same near-held width. In fact the emission angle is determined mainly by the disk radius instead of the disk thickness. A scalar diffraction theory in the cylindrical coordinate is developed to explain such an emission-angle-narrowing phenomenon and numerical calculation based on a vectorial diffraction theory is carried out to explain the measured polarization state. (C) 1998 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.121328en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.121328en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/32628
dc.identifier.wosnumberWOS:000073362300009
dc.language.isoen_USen_US
dc.titleFar-field emission narrowing effect of microdisk lasersen_US
dc.typeArticleen_US

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