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EFFECT OF SIH4/CH4 FLOW RATIO ON THE GROWTH OF BETA-SIC ON SI BY ELECTRON-CYCLOTRON-RESONANCE CHEMICAL-VAPOR-DEPOSITION AT 500-DEGREES-C

dc.citation.epage170en_US
dc.citation.issue2en_US
dc.citation.spage168en_US
dc.citation.volume66en_US
dc.citation.woscount33
dc.contributor.authorLIU, CCen_US
dc.contributor.authorLEE, CYen_US
dc.contributor.authorCHENG, KLen_US
dc.contributor.authorCHENG, HCen_US
dc.contributor.authorYEW, TRen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:03:34Z
dc.date.available2014-12-08T15:03:34Z
dc.date.issued1995-01-09en_US
dc.identifier.doi10.1063/1.113552en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.113552en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/2104
dc.identifier.wosnumberWOS:A1995QA69800019
dc.language.isoen_USen_US
dc.titleEFFECT OF SIH4/CH4 FLOW RATIO ON THE GROWTH OF BETA-SIC ON SI BY ELECTRON-CYCLOTRON-RESONANCE CHEMICAL-VAPOR-DEPOSITION AT 500-DEGREES-Cen_US
dc.typeArticleen_US

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