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三五族氮化合物半導體薄膜之物理特性研究---子計畫III:三五族氮化合物半導體物理特性以及電性量測分析與研究

dc.contributor.author陳振芳en_US
dc.contributor.authorCHEN JENN-FANGen_US
dc.contributor.department交通大學電子物理系zh_TW
dc.date.accessioned2014-12-13T10:37:20Z
dc.date.available2014-12-13T10:37:20Z
dc.date.issued1999en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC88-2112-M009-023zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=426255&docId=76117en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/94559
dc.language.isozh_TWen_US
dc.subject氮化合物zh_TW
dc.subject金屬有機化學蒸鍍法zh_TW
dc.subject深層能階zh_TW
dc.subject異質接面zh_TW
dc.subjectNitrideen_US
dc.subjectMetal organic chemical vapor deposition (MOCVD)en_US
dc.subjectDeep levelen_US
dc.subjectHeterojunctionen_US
dc.title三五族氮化合物半導體薄膜之物理特性研究---子計畫III:三五族氮化合物半導體物理特性以及電性量測分析與研究zh_TW
dc.titleStudy of Physics and Electrical Properties of III-V Nitride Semiconductorsen_US
dc.typePlanen_US

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