EPR EVIDENCE FOR COMPENSATING DEFECTS IN BATIO3 GRAIN-BOUNDARY BARRIER LAYER CAPACITORS
| dc.citation.epage | 245 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 239 | en_US |
| dc.citation.volume | 24 | en_US |
| dc.citation.woscount | 4 | |
| dc.contributor.author | CHIOU, BS | en_US |
| dc.contributor.author | LIN, ST | en_US |
| dc.contributor.author | DUH, JG | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:05:42Z | |
| dc.date.available | 2014-12-08T15:05:42Z | |
| dc.date.issued | 1990-01-01 | en_US |
| dc.identifier.issn | 0254-0584 | en_US |
| dc.identifier.journal | MATERIALS CHEMISTRY AND PHYSICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4236 | |
| dc.identifier.wosnumber | WOS:A1990CG18600002 | |
| dc.language.iso | en_US | en_US |
| dc.title | EPR EVIDENCE FOR COMPENSATING DEFECTS IN BATIO3 GRAIN-BOUNDARY BARRIER LAYER CAPACITORS | en_US |
| dc.type | Article | en_US |
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