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CMOS voltage reference based on threshold voltage and thermal voltage

dc.citation.epage15en_US
dc.citation.issue1en_US
dc.citation.spage9en_US
dc.citation.volume62en_US
dc.citation.woscount2
dc.contributor.authorLo, Tien-Yuen_US
dc.contributor.authorHung, Chung-Chihen_US
dc.contributor.authorIsmail, Mohammeden_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.date.accessioned2014-12-08T15:07:58Z
dc.date.available2014-12-08T15:07:58Z
dc.date.issued2010-01-01en_US
dc.identifier.doi10.1007/s10470-009-9321-yen_US
dc.identifier.issn0925-1030en_US
dc.identifier.journalANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSINGen_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10470-009-9321-yen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6267
dc.identifier.wosnumberWOS:000273030600002
dc.language.isoen_USen_US
dc.subjectVoltage referenceen_US
dc.subjectThreshold voltageen_US
dc.subjectWeak-inversionen_US
dc.titleCMOS voltage reference based on threshold voltage and thermal voltageen_US
dc.typeArticleen_US

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