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近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(III)
近場光聲顯微術在奈米尺度異結構殘留應力的量測研究(III)
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942212E009003.pdf
(2.55 MB)
Date
2005
Authors
尹慶中
YIN CHING-CHUNG
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https://www.grb.gov.tw/search/planDetail?id=1114345&docId=211465
https://ir.lib.nycu.edu.tw/handle/11536/90276
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