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Identifying a design management package to support concurrent design in building wafer fabrication facilities

dc.citation.epage614en_US
dc.citation.issue6en_US
dc.citation.spage606en_US
dc.citation.volume132en_US
dc.citation.woscount2
dc.contributor.authorDzeng, RJen_US
dc.contributor.department土木工程學系zh_TW
dc.contributor.departmentDepartment of Civil Engineeringen_US
dc.date.accessioned2014-12-08T15:16:31Z
dc.date.available2014-12-08T15:16:31Z
dc.date.issued2006-06-01en_US
dc.description.abstractConcurrent design is commonly used in building a semiconductor wafer fabrication facilities to shorten projects. Current practice in managing a design schedule involves preset milestones that represent percentages of completion. Such a simple control scheme does not provide sufficient information to support concurrent design. This study presents an analytical model that applies a cluster identification algorithm to separate the work of designing a multisystem project into management packages that support concurrent design. Tasks within a package have strong informational dependency relationships on each other, and are not suited for concurrent design. Tasks of different packages have weak dependency relationships on each other, and are suited for concurrent design. Tendering design work based on these packages may reduce the number of design interfaces between participating design firms. Possible application of the model includes the management of design schedule, design contract tendering, and design information flow.en_US
dc.identifier.doi10.1061/(ASCE)0733-9364(2006)132:6(606)en_US
dc.identifier.issn0733-9364en_US
dc.identifier.journalJOURNAL OF CONSTRUCTION ENGINEERING AND MANAGEMENT-ASCEen_US
dc.identifier.urihttp://dx.doi.org/10.1061/(ASCE)0733-9364(2006)132:6(606)en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/12214
dc.identifier.wosnumberWOS:000237666000008
dc.language.isoen_USen_US
dc.titleIdentifying a design management package to support concurrent design in building wafer fabrication facilitiesen_US
dc.typeArticleen_US

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