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Estimating capability index C-pk for processes with asymmetric tolerances

dc.citation.epage2604en_US
dc.citation.issue11en_US
dc.citation.spage2593en_US
dc.citation.volume29en_US
dc.citation.woscount6
dc.contributor.authorPearn, WLen_US
dc.contributor.authorLin, GHen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:45:51Z
dc.date.available2014-12-08T15:45:51Z
dc.date.issued2000en_US
dc.description.abstractPearn and Chen (1996) considered the process capability index C-pk, and investigated the statistical properties of its natural estimator under various process conditions. Their investigation, however, was restricted to processes with symmetric tolerances. Recently, Pearn and Chen (1998) considered a generalization of C-pk, referred to as C-pk(.), to cover processes with asymmetric tolerances. They investigated the statistical properties of the natural estimator of C-pk(.), and obtained the exact formulae for the expected value and variance. In this paper, we consider a new estimator of C-pk*, assuming the knowledge on P(mu greater than or equal to T) = p is available, where 0 less than or equal to p less than or equal to 1, which can be obtained from historical information of a stable process. We obtain the exact distribution of the new estimator assuming the process characteristic follows the normal distribution. We show that the new estimator is consistent, asymptotically unbiased, which converges to a mixture of two normal distributions. We also show that by adding suitable correction factors to the new estimator, we may obtain the UMVUE and the MLE of the generalization C-pk(.).en_US
dc.identifier.issn0361-0926en_US
dc.identifier.journalCOMMUNICATIONS IN STATISTICS-THEORY AND METHODSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/30832
dc.identifier.wosnumberWOS:000165138300016
dc.language.isoen_USen_US
dc.subjectprocess capability indexen_US
dc.subjectspecification limiten_US
dc.subjectprocess meanen_US
dc.subjectprocess standard deviationen_US
dc.titleEstimating capability index C-pk for processes with asymmetric tolerancesen_US
dc.typeArticleen_US

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