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Anomalous phosphorus cracker temperature-dependent photoluminescence spectra of InGaP grown by solid source molecular beam epitaxy

dc.citation.epageL821en_US
dc.citation.issue8Aen_US
dc.citation.spageL819en_US
dc.citation.volume39en_US
dc.citation.woscount0
dc.contributor.authorCheng, YCen_US
dc.contributor.authorTai, KCen_US
dc.contributor.authorChou, STen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:45:01Z
dc.date.available2014-12-08T15:45:01Z
dc.date.issued2000-08-01en_US
dc.description.abstractInGaP grown by solid source molecular beam epitaxy showed lower effective band-gap energy with increasing phosphorus cracker temperature. Anomalous photoluminescence (PL) spectra also indicated that a weaker ordering effect was initiated when the cracker temperature was higher. Since the variation of cracker temperature mainly changed the P-2/P-4 ratio, we believe that the more chemically reactive P-2 incorporates more In into the epilayer. Therefore, InGaP grown under a more Pt-rich condition has a higher In content which results in the lower band-gap energy instead of having an ordering effect.en_US
dc.identifier.doi10.1143/JJAP.39.L819en_US
dc.identifier.issn0021-4922en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.39.L819en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/30374
dc.identifier.wosnumberWOS:000088911600017
dc.language.isoen_USen_US
dc.subjectorderingen_US
dc.subjectSSMBEen_US
dc.subjectphotoluminescenceen_US
dc.subjectInGaPen_US
dc.subjectvalved crackeren_US
dc.titleAnomalous phosphorus cracker temperature-dependent photoluminescence spectra of InGaP grown by solid source molecular beam epitaxyen_US
dc.typeArticleen_US

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