超薄閘極氧化層元件可靠性研究
| dc.contributor.author | 汪大暉 | en_US |
| dc.contributor.author | WANG TAHUI | en_US |
| dc.contributor.department | 國立交通大學電子工程學系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:39:41Z | |
| dc.date.available | 2014-12-13T10:39:41Z | |
| dc.date.issued | 2001 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC90-2215-E009-069 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=665707&docId=126375 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/96741 | |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 超薄閘極 | zh_TW |
| dc.subject | 可靠度 | zh_TW |
| dc.subject | 氧化層 | zh_TW |
| dc.subject | 協助金屬-氧化物-半導體元件 | zh_TW |
| dc.subject | Ultra-thin gate | en_US |
| dc.subject | Reliability | en_US |
| dc.subject | Oxide layer | en_US |
| dc.subject | CMOS device | en_US |
| dc.title | 超薄閘極氧化層元件可靠性研究 | zh_TW |
| dc.title | Ultra-Thin Gate Dielectric CMOS Device Reliability | en_US |
| dc.type | Plan | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: