超大型積體電路測試與可測性設計課程發展---子計畫六：自動測試應用(III)

dc.contributor.author	李崇仁	en_US
dc.contributor.department	交通大學電子工程系	zh_TW
dc.date.accessioned	2014-12-13T10:37:38Z
dc.date.available	2014-12-13T10:37:38Z
dc.date.issued	1998	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.identifier.govdoc	NSC87-2512-S009-003-EE	zh_TW
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=334775&docId=59356	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/94781
dc.language.iso	zh_TW	en_US
dc.subject	超大型積體電路測試	zh_TW
dc.subject	自動測試機	zh_TW
dc.subject	課程發展	zh_TW
dc.subject	VLSI testing	en_US
dc.subject	Automatic testing equipment	en_US
dc.subject	Curriculum development	en_US
dc.title	超大型積體電路測試與可測性設計課程發展---子計畫六：自動測試應用(III)	zh_TW
dc.title	"VLSI Testing and Design for Testability" Course Development: Automatic Test Application (III)	en_US
dc.type	Plan	en_US

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