Characterizations of low-temperature electroluminescence from ZnO nanowire light-emitting arrays on the p-GaN layer

dc.citation.epage4111en_US
dc.citation.issue24en_US
dc.citation.spage4109en_US
dc.citation.volume35en_US
dc.citation.woscount5
dc.contributor.authorLu, Tzu-Chunen_US
dc.contributor.authorKe, Min-Yungen_US
dc.contributor.authorYang, Sheng-Chiehen_US
dc.contributor.authorCheng, Yun-Weien_US
dc.contributor.authorChen, Liang-Yien_US
dc.contributor.authorLin, Guan-Jhongen_US
dc.contributor.authorLu, Yu-Hsinen_US
dc.contributor.authorHe, Jr-Hauen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorHuang, JianJangen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:38:17Z
dc.date.available2014-12-08T15:38:17Z
dc.date.issued2010-12-15en_US
dc.description.abstractLow-temperature electroluminescence from ZnO nanowire light-emitting arrays is reported. By inserting a thin MgO current blocking layer in between ZnO nanowire and p-GaN, high-purity UV light emission at wavelength 398 nm was obtained. As the temperature is decreased, contrary to the typical GaN-based light emitting diodes, our device shows a decrease of optical output intensity. The results are associated with various carrier tunneling processes and frozen MgO defects. (C) 2010 Optical Society of Americaen_US
dc.identifier.doi10.1364/OL.35.004109en_US
dc.identifier.issn0146-9592en_US
dc.identifier.journalOPTICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1364/OL.35.004109en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/26226
dc.identifier.wosnumberWOS:000285387300009
dc.language.isoen_USen_US
dc.titleCharacterizations of low-temperature electroluminescence from ZnO nanowire light-emitting arrays on the p-GaN layeren_US
dc.typeArticleen_US

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