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In situ TEM investigation of dynamical changes of nanostructures

dc.citation.epage319en_US
dc.citation.issue3-6en_US
dc.citation.spage303en_US
dc.citation.volume70en_US
dc.contributor.authorChen, L. J.en_US
dc.contributor.authorWu, W. W.en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2014-12-08T15:47:44Z
dc.date.available2014-12-08T15:47:44Z
dc.date.issued2010-11-22en_US
dc.description.abstractIn situ investigation of the temperature induced phase transformation, structural and chemical evolution of nanocrystals is important for understanding the structure and stability of nanomaterials. Transmission electron microscopy (TEM), one of the most powerful tools for characterizing nanostructured materials, is essential for the development of nanotechnology. In situ TEM is a technique that allows a direct observation of dynamic properties in nanoscale. Recent development of ultra-high vacuum TEM (UHV-TEM) further enables the investigation on atomic-scale materials systems in a clean environment. The appropriate utilization of the UHV-TEM will be beneficial in studying the fundamental mechanisms of dynamic reactions, formation of transient phase, solid-state amorphization, epitaxial growth, growth kinetics and evolution of defects. In this paper, we present the most recent progress in observing dynamic processes in nanoscale by in situ UHV-TEM. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.mser.2010.06.014en_US
dc.identifier.issn0927-796Xen_US
dc.identifier.journalMATERIALS SCIENCE & ENGINEERING R-REPORTSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.mser.2010.06.014en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/31917
dc.language.isoen_USen_US
dc.subjectIn situ TEMen_US
dc.subjectDynamical changesen_US
dc.subjectNanostructuresen_US
dc.subjectEpitaxial growthen_US
dc.subjectSi nanoringsen_US
dc.subjectSi bicrystalsen_US
dc.subjectSilicide nanowiresen_US
dc.subjectCu electromigrationen_US
dc.subjectNanothermometryen_US
dc.titleIn situ TEM investigation of dynamical changes of nanostructuresen_US
dc.typeReviewen_US

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