Applying Expert Diagnosis Model to Collaborative Design Systems

dc.citation.epage	1861	en_US
dc.citation.issue	4-5	en_US
dc.citation.spage	1860	en_US
dc.citation.volume	4	en_US
dc.citation.woscount	1
dc.contributor.author	Wu, Cheng-Ru	en_US
dc.contributor.author	Chang, Che-Wei	en_US
dc.contributor.author	Chen, Chiu-Chin	en_US
dc.contributor.department	資訊管理與財務金融系註：原資管所+財金所	zh_TW
dc.contributor.department	Department of Information Management and Finance	en_US
dc.date.accessioned	2014-12-08T15:11:45Z
dc.date.available	2014-12-08T15:11:45Z
dc.date.issued	2011-04-01	en_US
dc.description.abstract	Thin film transistor liquid crystal display (TFT-LCD) industry need to control the development budget. The alarm management system (AMS) can test machine alarm. This study uses the grey relational analysis (GRA) the expert evaluation model to measure software quality management system of alarm in order to reduce system failures.	en_US
dc.identifier.doi	10.1166/asl.2011.1485	en_US
dc.identifier.issn	1936-6612	en_US
dc.identifier.journal	ADVANCED SCIENCE LETTERS	en_US
dc.identifier.uri	http://dx.doi.org/10.1166/asl.2011.1485	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/9016
dc.identifier.wosnumber	WOS:000294372900108
dc.language.iso	en_US	en_US
dc.subject	TFT-LCD Industry	en_US
dc.subject	AMS	en_US
dc.subject	GRA	en_US
dc.subject	Collaborative Design System	en_US
dc.title	Applying Expert Diagnosis Model to Collaborative Design Systems	en_US
dc.type	Article	en_US

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