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High-stability oxygen sensor based on amorphous zinc tin oxide thin film transistor

dc.citation.epageen_US
dc.citation.issue26en_US
dc.citation.volume100en_US
dc.citation.woscount4
dc.contributor.authorChen, Yu-Chunen_US
dc.contributor.authorChang, Ting-Changen_US
dc.contributor.authorLi, Hung-Weien_US
dc.contributor.authorChung, Wan-Fangen_US
dc.contributor.authorWu, Chang-Peien_US
dc.contributor.authorChen, Shih-Chingen_US
dc.contributor.authorLu, Jinen_US
dc.contributor.authorChen, Yi-Hsienen_US
dc.contributor.authorTai, Ya-Hsiangen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:23:34Z
dc.date.available2014-12-08T15:23:34Z
dc.date.issued2012-06-25en_US
dc.description.abstractThis research presents a sol-gel derived zinc tin oxide thin film transistor (TFT) as a high-stability oxygen sensor. Due to its high sensitivity, oxygen has been traditionally regarded as having a negative influence on the electrical characteristics of zinc-based TFTs; however, TFTs can also act as an oxygen sensor. After illumination with visible light in oxygen-rich ambient, a significant increase in drain current of nearly 10 4 times occurs with fixed gate and drain voltages. It is expected that an optimized method of illumination can help to reset the electrical characteristics or distinguish the on/off state of this reliable oxygen sensor. (C) 2012 American Institute of Physics. [ http://dx.doi.org/10.1063/1.4731773]en_US
dc.identifier.doi262908en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/262908en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/16470
dc.identifier.wosnumberWOS:000305831500067
dc.language.isoen_USen_US
dc.titleHigh-stability oxygen sensor based on amorphous zinc tin oxide thin film transistoren_US
dc.typeArticleen_US

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