THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE
| dc.citation.epage | 729 | en_US |
| dc.citation.issue | 8 | en_US |
| dc.citation.spage | 725 | en_US |
| dc.citation.volume | 24 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | YU, SY | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:06:27Z | |
| dc.date.available | 2014-12-08T15:06:27Z | |
| dc.date.issued | 1981 | en_US |
| dc.identifier.issn | 0038-1101 | en_US |
| dc.identifier.journal | SOLID-STATE ELECTRONICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/5025 | |
| dc.identifier.wosnumber | WOS:A1981LY15400005 | |
| dc.language.iso | en_US | en_US |
| dc.title | THE SELF-CONSISTENT ANALYSIS OF THE ON-SET OF STRONG INVERSION IN AN MOS-TRANSISTOR WITH DOUBLE-LAYER SUBSTRATE IMPURITY PROFILE | en_US |
| dc.type | Article | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: