Epitaxial layer of MgO (001) grown on Si(001)wafer by e-beam evaporation
| dc.citation.epage | E46 | en_US |
| dc.citation.issue | 1 | en_US |
| dc.citation.spage | E44 | en_US |
| dc.citation.volume | 304 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Lee, M. D. | en_US |
| dc.contributor.author | Lo, C. K. | en_US |
| dc.contributor.author | Peng, T. Y. | en_US |
| dc.contributor.author | Yau, K. L. | en_US |
| dc.contributor.author | Chen, S. Y. | en_US |
| dc.contributor.author | Yao, Y. D. | en_US |
| dc.contributor.department | 材料科學與工程學系 | zh_TW |
| dc.contributor.department | Department of Materials Science and Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:15:52Z | |
| dc.date.available | 2014-12-08T15:15:52Z | |
| dc.date.issued | 2006-09-01 | en_US |
| dc.description.abstract | MgO(0 0 1) has been growing successfully on Fe/Pd/Cu/Si(1 0 0) by e-beam evaporation as examined by X-ray diffraction and high resolution transmission microscope. We present the magnetic peculiarity of crystal structure Fe(0 0 1)/Pd(0 0 1)/Cu(0 0 1) on Si(0 0 1) substrate. The magnetic properties of the sample were measured by magneto-optical Kerr effect which shows an in-plane magnetocrystalline anisotropy. (C) 2006 Elsevier B. V. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.jmmm.2006.02.054 | en_US |
| dc.identifier.issn | 0304-8853 | en_US |
| dc.identifier.journal | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.jmmm.2006.02.054 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/11843 | |
| dc.identifier.wosnumber | WOS:000207211700015 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Texture | en_US |
| dc.subject | MgO (001) | en_US |
| dc.title | Epitaxial layer of MgO (001) grown on Si(001)wafer by e-beam evaporation | en_US |
| dc.type | Article | en_US |