SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM
| dc.citation.epage | 391 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 385 | en_US |
| dc.citation.volume | 21 | en_US |
| dc.citation.woscount | 4 | |
| dc.contributor.author | LEI, TF | en_US |
| dc.contributor.author | LEE, CL | en_US |
| dc.contributor.author | CHANG, CY | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:06:32Z | |
| dc.date.available | 2014-12-08T15:06:32Z | |
| dc.date.issued | 1978 | en_US |
| dc.identifier.issn | 0038-1101 | en_US |
| dc.identifier.journal | SOLID-STATE ELECTRONICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/5113 | |
| dc.identifier.wosnumber | WOS:A1978ES98800008 | |
| dc.language.iso | en_US | en_US |
| dc.title | SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM | en_US |
| dc.type | Article | en_US |
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