Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry
| dc.citation.epage | 2939 | en_US |
| dc.citation.spage | 2936 | en_US |
| dc.citation.volume | 36 | en_US |
| dc.citation.woscount | 55 | en_US |
| dc.contributor.author | Chiu, MH | en_US |
| dc.contributor.author | Lee, JY | en_US |
| dc.contributor.author | Su, DC | en_US |
| dc.contributor.department | 光電工程研究所 | zh_TW |
| dc.contributor.department | Institute of EO Enginerring | en_US |
| dc.date.accessioned | 2019-04-02T06:00:00Z | |
| dc.date.available | 2019-04-02T06:00:00Z | |
| dc.date.issued | 1997-05-01 | en_US |
| dc.description.abstract | A new method for measuring the refractive index is presented, First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium. (C) 1997 Optical Society of America. | en_US |
| dc.identifier.doi | 10.1364/AO.36.002936 | en_US |
| dc.identifier.issn | 0003-6935 | en_US |
| dc.identifier.journal | APPLIED OPTICS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1364/AO.36.002936 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/149510 | |
| dc.identifier.wosnumber | WOS:A1997WX24200031 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry | en_US |
| dc.type | Article | en_US |
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