Comments on "Reliability and component importance of a consecutive-k-out-of-n system" by Zuo
| dc.citation.epage | 1063 | en_US |
| dc.citation.issue | 6 | en_US |
| dc.citation.spage | 1061 | en_US |
| dc.citation.volume | 40 | en_US |
| dc.citation.woscount | 7 | |
| dc.contributor.author | Hwang, FK | en_US |
| dc.contributor.author | Cui, LR | en_US |
| dc.contributor.author | Chang, JC | en_US |
| dc.contributor.author | Lin, WD | en_US |
| dc.contributor.department | 應用數學系 | zh_TW |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Applied Mathematics | en_US |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:45:13Z | |
| dc.date.available | 2014-12-08T15:45:13Z | |
| dc.date.issued | 2000-06-01 | en_US |
| dc.description.abstract | Zuo claimed that the comparison of Birnbaum importance between two components for a consecutive-k-out-of-n:G system is the same as that for the F-system. We show that this is not the case and give a correct relation between the two systems. (C) 2000 Elsevier Science Ltd. All rights reserved. | en_US |
| dc.identifier.issn | 0026-2714 | en_US |
| dc.identifier.journal | MICROELECTRONICS RELIABILITY | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/30480 | |
| dc.identifier.wosnumber | WOS:000087640800019 | |
| dc.language.iso | en_US | en_US |
| dc.subject | consecutive-k-out-of-n system | en_US |
| dc.subject | reliability | en_US |
| dc.subject | Birnbaum importance | en_US |
| dc.title | Comments on "Reliability and component importance of a consecutive-k-out-of-n system" by Zuo | en_US |
| dc.type | Article | en_US |