Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability
| dc.citation.epage | 369 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.volume | 12 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | Yuan, Jiann-Shiun | en_US |
| dc.contributor.author | Yen, Hsuan-Der | en_US |
| dc.contributor.author | Chen, Shuyu | en_US |
| dc.contributor.author | Wang, Ruey-Lue | en_US |
| dc.contributor.author | Huang, Guo-Wei | en_US |
| dc.contributor.author | Juang, Ying-Zong | en_US |
| dc.contributor.author | Tu, Chih-Ho | en_US |
| dc.contributor.author | Yeh, Wen-Kuan | en_US |
| dc.contributor.author | Ma, Jun | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:23:37Z | |
| dc.date.available | 2014-12-08T15:23:37Z | |
| dc.date.issued | 2012-06-01 | en_US |
| dc.description.abstract | A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed. | en_US |
| dc.identifier.issn | 1530-4388 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/16522 | |
| dc.identifier.wosnumber | WOS:000305085100024 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Cascode class E | en_US |
| dc.subject | gate oxide breakdown | en_US |
| dc.subject | output power | en_US |
| dc.subject | power amplifier (PA) | en_US |
| dc.subject | power efficiency | en_US |
| dc.subject | reliability | en_US |
| dc.title | Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability | en_US |
| dc.type | Article | en_US |