<link rel="stylesheet" href="styles.cf390c6bfbe7555f.css"> Skip to main content

Antireflection and light trapping of subwavelength surface structures formed by colloidal lithography on thin film solar cells

dc.citation.epage142en_US
dc.citation.issue2en_US
dc.citation.spage135en_US
dc.citation.volume20en_US
dc.citation.woscount11
dc.contributor.authorTseng, Ping-Chenen_US
dc.contributor.authorTsai, Min-Anen_US
dc.contributor.authorYu, Peichenen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:21:53Z
dc.date.available2014-12-08T15:21:53Z
dc.date.issued2012-03-01en_US
dc.description.abstractIn this paper, we present a novel design of a surface nanostructure that suppresses the reflectivity and provides forward diffraction for light trapping. The structure under study comprises periodic nanoislands fabricated using self-assembly polystyrene spheres, which are applicable to large-area fabrication. We also show preliminary fabrication results of the proposed structure. The periodic nanoislands reduce the reflectivity through gradient effective refractive indices and enhance light trapping through diffraction in a periodic structure. We first systematically study the antireflection and light trapping effects using a rigorous coupled-wave analysis and then calculate the short-circuit current density of a 2-mu m-thick crystalline silicon with periodic nanoislands and an aluminum back reflector. The optimum short-circuit current density with periodic nanoislands achieves 25?mA/cm2 theoretically, which shows a 76.9% enhancement compared with that of bare silicon. Moreover, the structure also provides superior photocurrent densities at large angles of incidence, compared with conventional antireflection coatings. Copyright (c) 2011 John Wiley & Sons, Ltd.en_US
dc.identifier.doi10.1002/pip.1123en_US
dc.identifier.issn1062-7995en_US
dc.identifier.journalPROGRESS IN PHOTOVOLTAICSen_US
dc.identifier.urihttp://dx.doi.org/10.1002/pip.1123en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/15582
dc.identifier.wosnumberWOS:000300701600002
dc.language.isoen_USen_US
dc.subjectthin-film solar cellen_US
dc.subjectlight trappingen_US
dc.subjectantireflectionen_US
dc.subjectcolloidal lithographyen_US
dc.titleAntireflection and light trapping of subwavelength surface structures formed by colloidal lithography on thin film solar cellsen_US
dc.typeArticleen_US

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
000300701600002.pdf
Size:
813.5 KB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed to upon submission
Description: