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Simultaneous use of small- and wide-angle X-ray techniques to analyze nanometerscale phase separation in polymer heterojunction solar cells

dc.citation.epage+en_US
dc.citation.issue13en_US
dc.citation.spage2573en_US
dc.citation.volume20en_US
dc.citation.woscount126
dc.contributor.authorChiu, Mao-Yuanen_US
dc.contributor.authorJeng, U-Seren_US
dc.contributor.authorSu, Chiu-Hunen_US
dc.contributor.authorLiang, Keng S.en_US
dc.contributor.authorWei, Kung-Hwaen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2014-12-08T15:11:12Z
dc.date.available2014-12-08T15:11:12Z
dc.date.issued2008-07-02en_US
dc.description.abstractUsing grazing-incidence small-angle X-ray scattering and wide-angle X-ray diffraction techniques to analyze the nanoscale phase separation of P3HT and PCBM after annealing, the effects of the sizes of the PCBM clusters and P3HT crystallites on the power conversion efficiency of bulk heterojunction solar cells are studied.en_US
dc.identifier.doi10.1002/adma.200703097en_US
dc.identifier.issn0935-9648en_US
dc.identifier.journalADVANCED MATERIALSen_US
dc.identifier.urihttp://dx.doi.org/10.1002/adma.200703097en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/8586
dc.identifier.wosnumberWOS:000257808700020
dc.language.isoen_USen_US
dc.titleSimultaneous use of small- and wide-angle X-ray techniques to analyze nanometerscale phase separation in polymer heterojunction solar cellsen_US
dc.typeArticleen_US

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