Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection
| dc.citation.epage | 86 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 77 | en_US |
| dc.citation.volume | 30 | en_US |
| dc.citation.woscount | 2 | |
| dc.contributor.author | Huang, Hsuan-Ming | en_US |
| dc.contributor.author | Wen, Charles H. -P. | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 傳播研究所 | zh_TW |
| dc.contributor.department | 電機資訊學士班 | zh_TW |
| dc.contributor.department | 電機工程學系 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Communication Studies | en_US |
| dc.contributor.department | Undergraduate Honors Program of Electrical Engineering and Computer Science | en_US |
| dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:32:42Z | |
| dc.date.available | 2014-12-08T15:32:42Z | |
| dc.date.issued | 2013-03-01 | en_US |
| dc.identifier.doi | 10.1109/MDT.2012.2194471 | en_US |
| dc.identifier.issn | 2168-2356 | en_US |
| dc.identifier.journal | IEEE DESIGN & TEST | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/MDT.2012.2194471 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/22833 | |
| dc.identifier.wosnumber | WOS:000325497800010 | |
| dc.language.iso | en_US | en_US |
| dc.title | Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection | en_US |
| dc.type | Article | en_US |