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PushPull: Short-Path Padding for Timing Error Resilient Circuits

dc.citation.epage570en_US
dc.citation.issue4en_US
dc.citation.spage558en_US
dc.citation.volume33en_US
dc.citation.woscount0
dc.contributor.authorYang, Yu-Mingen_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.contributor.authorHo, Sung-Tingen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:36:24Z
dc.date.available2014-12-08T15:36:24Z
dc.date.issued2014-04-01en_US
dc.description.abstractModern IC designs are exposed to a wide range of dynamic variations. Traditionally, a conservative timing guardband is required to guarantee correct operations under the worst-case variation, thus leading to performance degradation. To remove the guardband, resilient circuits are proposed. However, the short-path padding (hold time fixing) problem in resilient circuits is far severer than conventional IC design. Therefore, in this paper, we focus on the short-path padding problem to enable the timing error detection and correction mechanism of resilient circuits. Unlike recent prior work adopts greedy heuristics with a local view, we determine the padding values and locations with a global view. Moreover, we utilize spare cells and a dummy metal to further achieve the derived padding values at physical implementation. Experimental results show that our method is promising to validate timing error-resilient circuits.en_US
dc.identifier.doi10.1109/TCAD.2014.2304681en_US
dc.identifier.issn0278-0070en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2014.2304681en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/24744
dc.identifier.wosnumberWOS:000338135300007
dc.language.isoen_USen_US
dc.subjectDelay paddingen_US
dc.subjectengineering change orderen_US
dc.subjecthold time fixingen_US
dc.subjectlinear programmingen_US
dc.subjectresilient circuitsen_US
dc.subjecttiming analysisen_US
dc.titlePushPull: Short-Path Padding for Timing Error Resilient Circuitsen_US
dc.typeArticleen_US

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