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Temperature Effect on Ku-Band Current-Reused Common-Gate LNA in 0.13-mu m CMOS Technology

dc.citation.epage2138en_US
dc.citation.issue9en_US
dc.citation.spage2131en_US
dc.citation.volume57en_US
dc.citation.woscount4
dc.contributor.authorChen, Wen-Linen_US
dc.contributor.authorChang, Sheng-Fuhen_US
dc.contributor.authorChen, Kun-Mingen_US
dc.contributor.authorHuang, Guo-Weien_US
dc.contributor.authorChang, Jen-Chungen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:08:45Z
dc.date.available2014-12-08T15:08:45Z
dc.date.issued2009-09-01en_US
dc.description.abstractThis paper presents the temperature effect on a Ku-band NMOS common-gate low-noise amplifier (CG-LNA). The temperature characteristics of an NMOS transistor and spiral inductors are obtained over the temperature range from 253 to 393 K. These results show that the optimal bias condition minimizes the transconductance and drain current temperature variations. Based on these results, a current-reused CG-LNA with good temperature performance is designed. At ambient temperatures, the CG-LNA has a measured power gain of 10.3 dB and a noise figure (NF) of 4.3 dB at 15.2 GHz, while consuming 4.5 mA from a 1.3-V power supply. When the temperature varies from 253 to 393 K, the CG-LNA has a power gain variation of 3 dB, NF variation of 2 dB, and dc power consumption variation of 11.9%. This paper is the first to report the temperature effect on Ku-band CG-LNAs.en_US
dc.identifier.doi10.1109/TMTT.2009.2027074en_US
dc.identifier.issn0018-9480en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2009.2027074en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6701
dc.identifier.wosnumberWOS:000269648800004
dc.language.isoen_USen_US
dc.subjectCMOSen_US
dc.subjectcommon gateen_US
dc.subjectcurrent reuseen_US
dc.subjectlow-noise amplifier (LNA)en_US
dc.subjectzero temperature coefficienten_US
dc.titleTemperature Effect on Ku-Band Current-Reused Common-Gate LNA in 0.13-mu m CMOS Technologyen_US
dc.typeArticleen_US

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