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Study of hole concentration of 1,4-bis[N-(1-naphthyl)-N-'-phenylamino]-4,4(') diamine doped with tungsten oxide by admittance spectroscopy

dc.citation.epageen_US
dc.citation.issue10en_US
dc.citation.volume89en_US
dc.citation.woscount35
dc.contributor.authorHsieh, Ming-Taen_US
dc.contributor.authorChang, Chan-Chingen_US
dc.contributor.authorChen, Jenn-Fangen_US
dc.contributor.authorChen, Chin H.en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department電子與資訊研究中心zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentMicroelectronics and Information Systems Research Centeren_US
dc.date.accessioned2014-12-08T15:15:49Z
dc.date.available2014-12-08T15:15:49Z
dc.date.issued2006-09-04en_US
dc.description.abstractThe effect of tungsten oxide (WO3) incorporation into 1,4-bis[N-(1-naphthyl)-N-'-phenylamino]-4,4(') diamine (NPB) layer is investigated in NPB-tris(8-hydroxyquinoline)aluminium heterojunction organic light-emitting diodes. The admittance spectroscopy studies show that increasing the WO3 volume percentage from 0% to 16% can increase the hole concentration of the NBP layer from 1.97x10(14) to 1.90x10(17) cm(-3) and decrease the activation energy of the resistance of the NPB layer from 0.354 to 0.176 eV. Thus, this incorporation reduces the Ohmic loss and increases the band bending in the NBP layer near the interface, resulting in an improved hole injection via tunneling through a narrow depletion region. (c) 2006 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.2345610en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2345610en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/11798
dc.identifier.wosnumberWOS:000240384000096
dc.language.isoen_USen_US
dc.titleStudy of hole concentration of 1,4-bis[N-(1-naphthyl)-N-'-phenylamino]-4,4(') diamine doped with tungsten oxide by admittance spectroscopyen_US
dc.typeArticleen_US

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