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High-performance TFTs with Si nanowire channels enhanced by metal-induced lateral crystallization

dc.citation.epage584en_US
dc.citation.issue7en_US
dc.citation.spage582en_US
dc.citation.volume27en_US
dc.citation.woscount21
dc.contributor.authorSu, CJen_US
dc.contributor.authorLin, HCen_US
dc.contributor.authorHuang, TYen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:16:17Z
dc.date.available2014-12-08T15:16:17Z
dc.date.issued2006-07-01en_US
dc.description.abstractThin-film transistors with poly-Si nanowire (NW) channels enhanced by metal-induced lateral crystallization (MILC) are reported. The new device features a side-gate with self-aligned NW channels abutting the sidewalls of the gate structure. By adopting the MILC technique, the crystallinity of the NW channels is greatly enhanced, compared to those formed by solid-phase crystallization. As a result, the electrical performance of the devices could be significantly enhanced in terms of reduced subthreshold swing and threshold voltage as well as improved field-effect mobility.en_US
dc.identifier.doi10.1109/LED.2006.877708en_US
dc.identifier.issn0741-3106en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2006.877708en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/12075
dc.identifier.wosnumberWOS:000238712200018
dc.language.isoen_USen_US
dc.subjectmetal-induced lateral crystallization (MILC)en_US
dc.subjectnanowires (NWs)en_US
dc.subjectthin-film transistors (TFTs)en_US
dc.titleHigh-performance TFTs with Si nanowire channels enhanced by metal-induced lateral crystallizationen_US
dc.typeArticleen_US

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