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Testing process precision for truncated normal distributions

dc.citation.epage2281en_US
dc.citation.issue12en_US
dc.citation.spage2275en_US
dc.citation.volume47en_US
dc.citation.woscount1
dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorHung, H. N.en_US
dc.contributor.authorPeng, N. F.en_US
dc.contributor.authorHuang, C. Y.en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:13:01Z
dc.date.available2014-12-08T15:13:01Z
dc.date.issued2007-12-01en_US
dc.description.abstractProcess precision index C, has been widely used in the manufacturing industry to provide numerical measures of process precision, which essentially reflects product quality consistency. Precision measures using C, for normal processes, contaminated normal processes, have been investigated extensively, but are neglected for truncated normal processes. Truncated normal processes are common in the manufacturing industry, particularly, for factories equipped with automatic machines handling fully inspections, and scrap/rework products falling outside the specification limits. If the processes follow the normal distribution, then the inspected products (processes) must follow the truncated normal distribution. In this note, we consider the precision measure for truncated normal processes. We investigate the analytically intractable sampling distribution of the estimated C, and obtain a rather accurate approximation. Using the results, we develop a practical testing procedure for practitioners to use in their in-plant applications. (C) 2007 Elsevier Ltd. All rights reserved.en_US
dc.identifier.doi10.1016/j.microrel.2006.12.001en_US
dc.identifier.issn0026-2714en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.microrel.2006.12.001en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/10046
dc.identifier.wosnumberWOS:000251484000050
dc.language.isoen_USen_US
dc.titleTesting process precision for truncated normal distributionsen_US
dc.typeArticleen_US

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