Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometry
| dc.citation.epage | en_US | |
| dc.citation.issue | 4 | en_US |
| dc.citation.volume | 50 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | Hsieh, Hung-Chih | en_US |
| dc.contributor.author | Wu, Wang-Tsung | en_US |
| dc.contributor.author | Chang, Wei-Yao | en_US |
| dc.contributor.author | Chen, Yen-Liang | en_US |
| dc.contributor.author | Su, Der-Chin | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:11:47Z | |
| dc.date.available | 2014-12-08T15:11:47Z | |
| dc.date.issued | 2011-04-01 | en_US |
| dc.description.abstract | The processes to derive the associated phase of an interference signal from the data of a series of recorded frames are performed, and we find that the sampling frequency being lower than the Nyquist sampling rate can also be applied to the full-field heterodyne interferometry. Two optimal sampling conditions for a commonly used CCD camera are proposed based on the relation between the heterodyne frequency and the contrast of the interference signal under the condition that the phase error is set to be 0.05 deg. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.356712] | en_US |
| dc.identifier.doi | 10.1117/1.3567172 | en_US |
| dc.identifier.issn | 0091-3286 | en_US |
| dc.identifier.journal | OPTICAL ENGINEERING | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1117/1.3567172 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/9028 | |
| dc.identifier.wosnumber | WOS:000290028900026 | |
| dc.language.iso | en_US | en_US |
| dc.subject | CCD camera | en_US |
| dc.subject | Nyquist sampling rate | en_US |
| dc.subject | full-field heterodyne interferometry | en_US |
| dc.subject | three-parameter sine fitting algorithm | en_US |
| dc.title | Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometry | en_US |
| dc.type | Article | en_US |