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An Investigation of Transient Effects in Poly(3-hexylthiophenes) Based Thin Film Transistors Caused by Oxygen and Water Molecules

dc.citation.epageH859en_US
dc.citation.issue9en_US
dc.citation.spageH854en_US
dc.citation.volume158en_US
dc.citation.woscount2
dc.contributor.authorChang, Chia-Haoen_US
dc.contributor.authorChen, Meng-Feien_US
dc.contributor.authorChien, Chao-Hsinen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:37:44Z
dc.date.available2014-12-08T15:37:44Z
dc.date.issued2011en_US
dc.description.abstractIn this article, we investigate hysteresis behavior observed in the current-voltage transfer curve of regioregular poly(3-hexylthiophene)(P3HT) based thin film transistors (PTFTs) using bi-directional voltage sweeping. According to the results of our experiments, the hysteresis effects were closely related to oxygen (O(2)) and water (H(2)O) molecules residing in the P3HT active layer. As a result, we hypothesized that O(2) and H(2)O in the P3HT could form two kinds of dopants, i.e., stable and transient states. Stable state dopants, which are commonly thought to be of the acceptor-type dopants, could induce holes in the channel region contributing to better on-current. On the contrary, transient state dopants were found to be unable to induce holes, however could enable the formation of polarization agents and create hysteresis. These two types of dopants seem have a common origin, thus they could be converted into each other through the combination of specific processes and applied external bias. From the viewpoint of device operation stability, except on-current level and characteristics including threshold voltage, off-current magnitude and on/off ratio, the impact of hysteresis should garner the attention of those pursuing high performance PTFTs. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3604963] All rights reserved.en_US
dc.identifier.doi10.1149/1.3604963en_US
dc.identifier.issn0013-4651en_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.identifier.urihttp://dx.doi.org/10.1149/1.3604963en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/25944
dc.identifier.wosnumberWOS:000293175600052
dc.language.isoen_USen_US
dc.titleAn Investigation of Transient Effects in Poly(3-hexylthiophenes) Based Thin Film Transistors Caused by Oxygen and Water Moleculesen_US
dc.typeArticleen_US

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