Foreword for the Special Issue on ESD Technology
| dc.citation.epage | 588 | en_US |
| dc.citation.issue | 4 | en_US |
| dc.citation.spage | 588 | en_US |
| dc.citation.volume | 12 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Boselli, Gianluca | en_US |
| dc.contributor.author | Ker, Ming-Dou | en_US |
| dc.contributor.author | Duvvury, Charvaka | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:28:53Z | |
| dc.date.available | 2014-12-08T15:28:53Z | |
| dc.date.issued | 2012-12-01 | en_US |
| dc.identifier.doi | 10.1109/TDMR.2012.2225232 | en_US |
| dc.identifier.issn | 1530-4388 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/TDMR.2012.2225232 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/20862 | |
| dc.identifier.wosnumber | WOS:000312101900002 | |
| dc.language.iso | en_US | en_US |
| dc.title | Foreword for the Special Issue on ESD Technology | en_US |
| dc.type | Editorial Material | en_US |