Thickness Dependent Phase Behavior of Antiferroelectric Liquid Crystal Films
| dc.citation.epage | 0 | en_US |
| dc.citation.issue | 18 | en_US |
| dc.citation.spage | 0 | en_US |
| dc.citation.volume | 103 | en_US |
| dc.citation.woscount | 9 | en_US |
| dc.contributor.author | Pan, LiDong | en_US |
| dc.contributor.author | Wang, Shun | en_US |
| dc.contributor.author | Hsu, C. S. | en_US |
| dc.contributor.author | Huang, C. C. | en_US |
| dc.contributor.department | 應用化學系 | zh_TW |
| dc.contributor.department | Department of Applied Chemistry | en_US |
| dc.date.accessioned | 2019-04-03T06:37:33Z | |
| dc.date.available | 2019-04-03T06:37:33Z | |
| dc.date.issued | 2009-10-30 | en_US |
| dc.description.abstract | Free standing films of a liquid crystal compound with simple surface enhanced order were studied. The resultant phase diagram demonstrates that (1) the short helical pitch smectic-C-alpha* phase disappears below a film thickness of 10 layers, and (2) the temperature window of a distorted 4 layer smectic-C-FI2* phase increases dramatically upon decreasing film thickness. The experimental findings were attributed to the reduced dimensionality and enhanced surface effects in thin films. The results of the smectic-C-alpha* phase are consistent with what have been reported for helically ordered magnetic thin films, with a noticeable difference due to the opposite effect of the surface on ordering in the two systems. | en_US |
| dc.identifier.doi | 10.1103/PhysRevLett.103.187802 | en_US |
| dc.identifier.issn | 0031-9007 | en_US |
| dc.identifier.journal | PHYSICAL REVIEW LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevLett.103.187802 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/6548 | |
| dc.identifier.wosnumber | WOS:000271352400044 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Thickness Dependent Phase Behavior of Antiferroelectric Liquid Crystal Films | en_US |
| dc.type | Article | en_US |