NEW OBSERVATION OF CHARGE INJECTION IN MOS ANALOG SWITCHES
| dc.citation.epage | 214 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 213 | en_US |
| dc.citation.volume | 30 | en_US |
| dc.citation.woscount | 2 | |
| dc.contributor.author | CHEN, MJ | en_US |
| dc.contributor.author | GU, YB | en_US |
| dc.contributor.author | WU, T | en_US |
| dc.contributor.author | HSU, PC | en_US |
| dc.contributor.author | LIU, TH | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:04:07Z | |
| dc.date.available | 2014-12-08T15:04:07Z | |
| dc.date.issued | 1994-02-03 | en_US |
| dc.description.abstract | Based on experimental analogue MOS switches, the Letter reports a new observation of the charge injection component due to channel charges in weak inversion. As identified by the mixed-mode circuit and device simulations, this new component can contribute comparably to the switch-induced error voltage on a switched capacitor. | en_US |
| dc.identifier.doi | 10.1049/el:19940177 | en_US |
| dc.identifier.issn | 0013-5194 | en_US |
| dc.identifier.journal | ELECTRONICS LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1049/el:19940177 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/2618 | |
| dc.identifier.wosnumber | WOS:A1994MX97100030 | |
| dc.language.iso | en_US | en_US |
| dc.subject | INTEGRATED CIRCUITS | en_US |
| dc.subject | SWITCHED CAPACITOR NETWORKS | en_US |
| dc.title | NEW OBSERVATION OF CHARGE INJECTION IN MOS ANALOG SWITCHES | en_US |
| dc.type | Article | en_US |