LIQUID-PHASE BONDING OF YTTRIA-STABILIZED ZIRCONIA WITH CAO-TIO2-SIO2 GLASS
| dc.citation.epage | 1301 | en_US |
| dc.citation.issue | 5 | en_US |
| dc.citation.spage | 1295 | en_US |
| dc.citation.volume | 30 | en_US |
| dc.citation.woscount | 2 | |
| dc.contributor.author | CHIOU, BS | en_US |
| dc.contributor.author | YOUNG, CD | en_US |
| dc.contributor.author | DUH, JG | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:03:30Z | |
| dc.date.available | 2014-12-08T15:03:30Z | |
| dc.date.issued | 1995-03-01 | en_US |
| dc.description.abstract | A 36.8wt % CaO-26.2 wt % TiO2-37.0 wt % SiO2 glass (CTS) was employed as the ceramic brazer for the bonding of 3 mol % yttria stabilized zirconia (YSZ3). Sandwich-like YSZ3-CTS-YSZ3 specimens were fabricated and temperature dependence of the bonding strength was evaluated. An optimum bonding process was achieved at a bonding temperature of 1424 degrees C for 30 min with CTS glass slurry having a glass/organic ratio of 1.82. The effects of processing parameters on the bending was investigated on the basis of the metallurgical evolution at the interface. In addition, predominating factors affecting the bonding strength were also explored. | en_US |
| dc.identifier.doi | 10.1007/BF00356134 | en_US |
| dc.identifier.issn | 0022-2461 | en_US |
| dc.identifier.journal | JOURNAL OF MATERIALS SCIENCE | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1007/BF00356134 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/2034 | |
| dc.identifier.wosnumber | WOS:A1995QL40000025 | |
| dc.language.iso | en_US | en_US |
| dc.title | LIQUID-PHASE BONDING OF YTTRIA-STABILIZED ZIRCONIA WITH CAO-TIO2-SIO2 GLASS | en_US |
| dc.type | Article | en_US |