Effect of passivation layer on InGaZnO thin-film transistors with hybrid silver nanowires as source and drain electrodes
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10.7567/JJAP.54.081101
Abstract
InGaZnO (IGZO) thin-film transistors (TFTs) with hybrid silver nanowires (hybrid-AgNWs) as the source and drain electrodes exhibit superior performance according to the on/off current ratio (approximate to 10(6)), subthreshold swing (SS) (367 mV/decade), and mobility (15.6 cm(2) V-1 s(-1)). The transfer and output characteristics of nanowire-based electrodes are comparable with those of titanium electrodes. The devices are fabricated on a plastic substrate and are highly transparent (>70%) and flexible. The device performance is severely degraded during operation in air, especially under high humidity conditions, and progressive deterioration resulting from water molecule diffusion leads to a high current density when the device is swept. Hence, introducing a passivation layer on the hybrid-AgNW electrodes is imperative. (C) 2015 The Japan Society of Applied Physics