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Oxide-Relief and Zn-Diffusion 850-nm Vertical-Cavity Surface-Emitting Lasers With Extremely Low Energy-to-Data-Rate Ratios for 40 Gbit/s Operations

dc.citation.epageen_US
dc.citation.issue2en_US
dc.citation.volume19en_US
dc.citation.woscount5
dc.contributor.authorShi, Jin-Weien_US
dc.contributor.authorYan, Jhih-Chengen_US
dc.contributor.authorWun, Jhih-Minen_US
dc.contributor.authorChen, Jasonen_US
dc.contributor.authorYang, Ying-Jayen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:30:23Z
dc.date.available2014-12-08T15:30:23Z
dc.date.issued2013-03-01en_US
dc.description.abstractWe demonstrate novel structures of a vertical-cavity surface-emitting laser (VCSEL) for high-speed (similar to 40 Gbit/s) operation with ultralow power consumption performance. Downscaling the size of oxide aperture of VCSELs is one of the most effective ways to reduce the power consumption during high-speed operation. However, such miniaturized oxide apertures (similar to 2 mu m diameter) in VCSELs will result in a large differential resistance, optical single-mode output, and a small maximum output power (< 1 mW). These characteristics seriously limit the maximum electrical-to-optical (E-O) bandwidth and device reliability. By the use of the oxide-relief and Zn-diffusion techniques in our demonstrated 850-nm VCSELs, we can not only release the burden imposed on downscaling the current-confined aperture for high speed with low-power consumption performance, but can also manipulate the number of optical modes inside the cavity to maximize the E-O bandwidth and product of bit-rate transmission distance in an OM4 fiber. State-of-the-art dynamic performances at both room temperature and 85 degrees C operations can be achieved by the use of our device. These include extremely high D-factors (similar to 13.5 GHz/mA(1/2)), as well as record-low energy-to-data ratios (EDR: 140 fJ/bit) at 34 Gbit/s operation, and error-free transmission over a 0.8-km OM4 multimode fiber with a record-low energy-to-data distance ratio (EDDR: 175.5 fJ/bit. km) at 25 Gbit/s.en_US
dc.identifier.doi10.1109/JSTQE.2012.2210863en_US
dc.identifier.issn1077-260Xen_US
dc.identifier.journalIEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSTQE.2012.2210863en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/21736
dc.identifier.wosnumberWOS:000317781200016
dc.language.isoen_USen_US
dc.subjectSemiconductor lasersen_US
dc.subjectvertical-cavity surface-emittingen_US
dc.subjectlasers (VCSELs).en_US
dc.titleOxide-Relief and Zn-Diffusion 850-nm Vertical-Cavity Surface-Emitting Lasers With Extremely Low Energy-to-Data-Rate Ratios for 40 Gbit/s Operationsen_US
dc.typeArticleen_US

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