A NEW METHOD FOR DETERMINING THE TERMINAL SERIES RESISTANCES AND HIGH-INJECTION COEFFICIENT OF BIPOLAR-TRANSISTORS IN CMOS INTEGRATED-CIRCUITS FOR COMPUTER-AIDED CIRCUIT MODELING
| dc.citation.epage | 936 | en_US |
| dc.citation.issue | 5 | en_US |
| dc.citation.spage | 929 | en_US |
| dc.citation.volume | 31 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | YANG, YH | en_US |
| dc.contributor.author | WU, CY | en_US |
| dc.contributor.author | CHEN, WY | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:06:00Z | |
| dc.date.available | 2014-12-08T15:06:00Z | |
| dc.date.issued | 1988-05-01 | en_US |
| dc.identifier.issn | 0038-1101 | en_US |
| dc.identifier.journal | SOLID-STATE ELECTRONICS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4537 | |
| dc.identifier.wosnumber | WOS:A1988N204100014 | |
| dc.language.iso | en_US | en_US |
| dc.title | A NEW METHOD FOR DETERMINING THE TERMINAL SERIES RESISTANCES AND HIGH-INJECTION COEFFICIENT OF BIPOLAR-TRANSISTORS IN CMOS INTEGRATED-CIRCUITS FOR COMPUTER-AIDED CIRCUIT MODELING | en_US |
| dc.type | Article | en_US |
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