Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel
| dc.citation.epage | 240 | en_US |
| dc.citation.issue | en_US | |
| dc.citation.spage | 236 | en_US |
| dc.citation.volume | 51 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Wang, Yao-Chin | en_US |
| dc.contributor.author | Lin, Bor-Shyh | en_US |
| dc.contributor.author | Yang, Kei-Hsiung | en_US |
| dc.contributor.department | 光電系統研究所 | zh_TW |
| dc.contributor.department | 影像與生醫光電研究所 | zh_TW |
| dc.contributor.department | Institute of Photonic System | en_US |
| dc.contributor.department | Institute of Imaging and Biomedical Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:35:49Z | |
| dc.date.available | 2014-12-08T15:35:49Z | |
| dc.date.issued | 2014-05-01 | en_US |
| dc.description.abstract | Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement. (C) 2014 Elsevier Ltd. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.measurement.2014.02.022 | en_US |
| dc.identifier.issn | 0263-2241 | en_US |
| dc.identifier.journal | MEASUREMENT | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.measurement.2014.02.022 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/24206 | |
| dc.identifier.wosnumber | WOS:000336016400024 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Flaw detection | en_US |
| dc.subject | Measurement | en_US |
| dc.subject | 4K Ultra HD | en_US |
| dc.subject | TFT array panel | en_US |
| dc.title | Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel | en_US |
| dc.type | Article | en_US |