SPECIFIC CONTACT RESISTIVITY MEASUREMENT BY A VERTICAL KELVIN TEST STRUCTURE
| dc.citation.epage | 1395 | en_US |
| dc.citation.issue | 6 | en_US |
| dc.citation.spage | 1390 | en_US |
| dc.citation.volume | 34 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | TAN, FL | en_US |
| dc.contributor.author | LEU, LY | en_US |
| dc.contributor.author | CHUNG, LL | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:06:04Z | |
| dc.date.available | 2014-12-08T15:06:04Z | |
| dc.date.issued | 1987-06-01 | en_US |
| dc.identifier.issn | 0018-9383 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4640 | |
| dc.identifier.wosnumber | WOS:A1987H779400022 | |
| dc.language.iso | en_US | en_US |
| dc.title | SPECIFIC CONTACT RESISTIVITY MEASUREMENT BY A VERTICAL KELVIN TEST STRUCTURE | en_US |
| dc.type | Article | en_US |